31.200: Integrated circuits. Microelectronics

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  1. BS 03/105045 DC▹

    IEC 62132-3. Ed.1. Integrated circuits. Measurement of electromagnetic immunity, 150 KHz to 1 GHz. Part 3. Measurement of conducted immunity. Bulk current injection method

    standard by BSI Group, 08/11/2003.

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  2. BS 04/30114936 DC▹

    EN 50439. Railway applications. Reliability tests for high power semiconductors devices. Part 1. Standard base-plate modules

    standard by BSI Group, 06/09/2004.

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  3. BS 04/30118622 DC▹

    IEC 62404 ED 1. I/O interface model for integrated circuits (IMIC)

    standard by BSI Group, 08/19/2004.

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  4. BS 05/30137850 DC▹

    IEC 62215-2. Integrated circuits. Measurement of impulse immunity. Part 2. Impulse injection method

    standard by BSI Group, 08/10/2005.

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  5. BS 06/30151320 DC▹

    BS IEC 62132-2. Integrated Circuits, Measurement of Electro magnetic Immunity, 150 kHz to 1 GHz. Part 2. Measurement of Radiated Immunity Tem-Cell and Wideband Tem-Cell Method

    standard by BSI Group, 06/09/2006.

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  6. BS 06/30152634 DC▹

    BS IEC 62433. Models of Integrated Circuits for EMI behavioural simulation

    standard by BSI Group, 07/05/2006.

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  7. BS 06/30153491 DC▹

    EN 60748-2-20. Semiconductor devices. Integrated circuits. Part 2-20. Digital integrated circuits. Family specification. Low voltage integrated circuits

    standard by BSI Group, 07/19/2006.

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  8. HISTORICAL

    BS 07/30162877 DC▹

    This document has been replaced. View the most recent version.

    BS ISO/IEC 14443-1. Identification cards. Contactless integrated circuit(s) cards. Proximity cards. Part 1. Physical characteristics

    standard by BSI Group, 02/22/2007.

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    Historical Editions: ISO/IEC 14443-1:2018, ISO/IEC 14443-1:2016, ISO/IEC 14443-1:2008, ISO/IEC 14443-1:2000

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  9. HISTORICAL

    BS 07/30163156 DC▹

    This document has been replaced. View the most recent version.

    BS EN 62433-2. Models of integrated circuits for EMI behavioural simulation - ICEM-CE, ICEM Conducted Emission Model

    standard by BSI Group, 03/01/2007.

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    Historical Editions: BS EN 62433-2:2017, BS EN 62433-2:2010

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  10. BS 09/30191126 DC▹

    BS EN 62132-8. Integrated circuits. Measurement of electromagnetic immunity. Part 8. Measurement of radiated immunity. IC Stripline method

    standard by BSI Group, 02/03/2009.

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