31.200: Integrated Circuits. Microelectronics
Search Results
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HISTORICAL
ASTM F773M-96
This document has been replaced. View the most recent version.
Practice for Measuring Dose Rate Response of Linear Integrated Circuits
standard by ASTM International, 06/10/1996.
Languages: English
Historical Editions: ASTM F773M-16, ASTM F773M-10, ASTM F773M-96(2003)
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HISTORICAL
ASTM F1259M-96
This document has been replaced. View the most recent version.
Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric]
standard by ASTM International, 01/01/1996.
Languages: English
Historical Editions: ASTM F1259M-96(2003)
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HISTORICAL
ASTM F1262M-95(2002)
This document has been replaced. View the most recent version.
Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
standard by ASTM International, 12/10/2002.
Languages: English
Historical Editions: ASTM F1262M-14, ASTM F1262M-95(2008), ASTM F1262M-95
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MOST RECENT
ASTM F773M-16 [ Withdrawn ]
Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric) (Withdrawn 2023)
standard by ASTM International, 05/01/2016.
Languages: English
Historical Editions: ASTM F773M-10, ASTM F773M-96(2003), ASTM F773M-96
- Redlines
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HISTORICAL
ASTM F1513-99
This document has been replaced. View the most recent version.
Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications
standard by ASTM International, 12/10/1999.
Languages: English
Historical Editions: ASTM F1513-99(2011), ASTM F1513-99(2003)
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HISTORICAL
ASTM F1513-99(2003)
This document has been replaced. View the most recent version.
Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications
standard by ASTM International, 01/01/2003.
Languages: English
Historical Editions: ASTM F1513-99(2011), ASTM F1513-99
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MOST RECENT
ASTM F1513-99(2011) [ Withdrawn ]
Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications (Withdrawn 2020)
standard by ASTM International, 06/01/2011.
Languages: English
Historical Editions: ASTM F1513-99(2003), ASTM F1513-99
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HISTORICAL
ASTM F1260M-96
This document has been replaced. View the most recent version.
Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]
standard by ASTM International, 01/01/1996.
Languages: English
Historical Editions: ASTM F1260M-96(2003)
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HISTORICAL
ASTM F744M-97
This document has been replaced. View the most recent version.
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits
standard by ASTM International, 01/01/1997.
Languages: English
Historical Editions: ASTM F744M-16, ASTM F744M-10, ASTM F744M-97(2003)
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MOST RECENT
ASTM F744M-16 [ Withdrawn ]
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)
standard by ASTM International, 05/01/2016.
Languages: English
Historical Editions: ASTM F744M-10, ASTM F744M-97(2003), ASTM F744M-97
- Redlines
