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About This Item

 

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Partially replaces BS EN 60749:1999.

All current amendments available at time of purchase are included with the purchase of this document.
 

Document History

  1. BS EN 60749-19:2003+A1:2010

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    Semiconductor devices. Mechanical and climatic test methods-Die shear strength

    • Most Recent
  2. BS EN 60749-19:2003


    Semiconductor devices. Mechanical and climatic test methods. Die shear strength

    • Historical Version
  3. BS EN 60749:1999


    Semiconductor devices. Mechanical and climatic test methods

    • Historical Version
  4. BS 6493-3:1985


    Semiconductor devices-Mechanical and climatic test methods

    • Historical Version