31.080:Semiconductor devices

Search Results

  1. BS 04/30063259 DC▹

    IEC 61988-4. Plasma display panels. Part 4. Environmental, endurance and mechanical

    standard by BSI Group, 07/09/2004.

    Languages:

    Track It

  2. BS 04/30113827 DC▹

    Draft British Standard. IEC62374 ED.1. Time dependent dielectric breakdown test

    standard by BSI Group, 05/19/2004.

    Languages:

    Track It

  3. BS 04/30119207 DC▹

    IEC 60747-20-1. Semiconductor devices. Part 20-1. Handling, packing, labelling, shipping and use of moisture reflow sensitive surface mount devices

    standard by BSI Group, 08/27/2004.

    Languages:

    Track It

  4. BS 04/30126443 DC▹

    IEC 60749-38 ED.1. Semiconductor devices mechanical and climatic test methods. Part 38. Soft error rate testing of electronic components

    standard by BSI Group, 12/08/2004.

    Languages:

    Track It

  5. BS 05/30127455 DC▹

    IEC 62258-4 ED.1. Semiconductor die products. Part 4. Questionnaire for die users and suppliers

    standard by BSI Group, 01/11/2005.

    Languages:

    Track It

  6. BS 05/30135664 DC▹

    IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods. Part 37. Board level drop test method of components for handheld electronic products

    standard by BSI Group, 06/30/2005.

    Languages:

    Track It

  7. BS 05/30143244 DC▹

    IEC 62341-1-1. Organic light emitting diode displays. Part 1-1. Generic specification

    standard by BSI Group, 12/07/2005.

    Languages:

    Track It

  8. MOST RECENT

    BS IEC 60747-18-4:2023▹

    Semiconductor devices-Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

    standard by British Standard / International Electrotechnical Commission, 03/27/2023.

    Languages: English

    • 👥MULTI-USER

    Priced From:

    Track It

  9. MOST RECENT

    BS IEC 60747-19-1:2019▹

    Semiconductor devices-Smart sensors. Control scheme of smart sensors

    standard by British Standard / International Electrotechnical Commission, 11/29/2019.

    Languages: English

    Historical Editions: BS 18/30380453DC

    • 👥MULTI-USER

    Priced From:

    Track It

  10. HISTORICAL

    BS EN 60749-29:2003▹

    This document has been replaced. View the most recent version.

    Semiconductor devices. Mechanical and climatic test methods-Latch-up test

    standard by British-Adopted European Standard, 06/29/2004.

    Languages: English

    Historical Editions: BS EN 60749-29:2011, BS EN 60749:1999, BS 6493-3:1985

    • 👥MULTI-USER

    Priced From:

    Track It