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BS EN IEC 60749-13:2018

Semiconductor devices. Mechanical and climatic test methods-Salt atmosphere

standard by British-Adopted European Standard , 04/30/2018

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About This Item

 

Full Description

BS EN IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.

The salt atmosphere test is considered destructive.


Cross References:
IEC 60749-14
EN 60749-14
MIL-STD-883J


All current amendments available at time of purchase are included with the purchase of this document.
 

Product Details

Published:
04/30/2018
ISBN(s):
9780580984228
Number of Pages:
20
File Size:
1 file , 930 KB
Product Code(s):
30360035, 30360035, 30360035
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. BS EN IEC 60749-13:2018

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    Semiconductor devices. Mechanical and climatic test methods-Salt atmosphere

    • Most Recent

  2. BS EN 60749:1999


    Semiconductor devices. Mechanical and climatic test methods

    • Historical Version

  3. BS EN 60749-13:2002


    Semiconductor devices. Mechanical and climatic test methods-Salt atmosphere

    • Historical Version

  4. BS 6493-3:1985


    Semiconductor devices-Mechanical and climatic test methods

    • Historical Version