Uniform preferred test methods and values for stress levels for judging the environmental properties of semiconductor devices (discrete and integrated circuits) from which a selection may be made.

Cross References: IEC 60068-1:1988*EN 60068-1:1994*IEC 60068-2-3:1985*CENELEC HD 323.2.3 S3:1987*IEC 60068-2-6:1995*IEC 60068-2-6:1995/Corrigendum:1995*EN 60068-2-6:1995*IEC 60068-2-7:1983*EN 60068-2-7:1993 *IEC 60068-2-11:1981*CENELEC HD 323.2.11 S1:1988*IEC 60068-2-13:1983*CENELEC HD 323.2.13 S1:1987*IEC 60068-2-14:1984*CENELEC HD 323.2.14 S2:1987*IEC 60068-2-17:1994*EN 60068-2-17:1994*IEC 60068-2-20:1979*CENELEC HD 323.2.20 S3:1988*IEC 60068-2-21:1983*EN 60068-2-21:1997*IEC 60068-2-45:1980*EN 60068-2-45:1992*IEC 60068-2-47:1982*EN 60068-2-47:1993*IEC 60068-2-48:1982*CENELEC HD 323.2.48 S1:1988*IEC 60653:1979*IEC 60695-2-2:1991*EN 60695-2-2:1994*IEC 60747-1:1983*IEC 60748-1:1984*

Replaced by parts of BS EN 60749 but remains current.