1804284

BS EN 60749-23:2004+A1:2011

Semiconductor devices. Mechanical and climatic test methods-High temperature operating life

standard by British-Adopted European Standard , 06/30/2011

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Cross References:
IEC 60747
IEC 60749-34
EN 60747
EN 60749-34:2004


Incorporates the following:
Amendment, June 2011. Amends and replaces BS EN 60749-23:2004 which remains current
 

Product Details

Published:
06/30/2011
ISBN(s):
9780580687532
Number of Pages:
12
File Size:
1 file , 620 KB
Product Code(s):
30208090, 30208090, 30208090
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. BS EN 60749-23:2004+A1:2011

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    Semiconductor devices. Mechanical and climatic test methods-High temperature operating life

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  2. BS EN 60749-23:2004


    Semiconductor devices. Mechanical and climatic test methods. High temperature operating life

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