1850712

BS EN 60749-27:2006+A1:2012

Semiconductor devices. Mechanical and climatic test methods-Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)

standard by British-Adopted European Standard , 01/31/2013

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Full Description



Cross References:
IEC 61340-3-2
IEC 60749-26
EN 61340-3-2:2002
EN 60749-26:2006


Partially replaces BS EN 60749:1999.

Incorporates the following:
Amendment, January 2013. Amends and replaces BS EN 60749-27:2006
 

Product Details

Published:
01/31/2013
ISBN(s):
9780580766084
Number of Pages:
16
File Size:
1 file , 620 KB
Product Code(s):
30252691, 30252691, 30252691
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. BS EN 60749-27:2006+A1:2012

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    Semiconductor devices. Mechanical and climatic test methods-Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)

    • Most Recent

  2. BS EN 60749-27:2006


    Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)

    • Historical Version

  3. BS EN 60749:1999


    Semiconductor devices. Mechanical and climatic test methods

    • Historical Version

  4. BS 6493-3:1985


    Semiconductor devices-Mechanical and climatic test methods

    • Historical Version