2665755

DANSK DS/EN 60749-18 [ Withdrawn ]

Semiconductor devices – Mechanical and climatic test methods – Part 18: Ionizing radiation (total dose)

standard by Dansk Standard , 03/21/2003

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W/D S/S BY DS/EN IEC 60749-18

This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.

 

Product Details

Edition:
03
Published:
03/21/2003
Number of Pages:
22
File Size:
1 file , 200 KB
Product Code(s):
DS-021, DS-021
 

Document History

  1. DANSK DSF/PREN 60749-18


    Semiconductor devices – Mechanical and climatic test methods – Part 18: Ionizing radiation (total dose)

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  2. DANSK DS/EN 60749-18

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    Semiconductor devices – Mechanical and climatic test methods – Part 18: Ionizing radiation (total dose)

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