2698422

DANSK DS/EN 60749-25 [ Active ]

Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling

standard by Dansk Standard , 01/05/2004

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Full Description

SAME AS IEC 60749-25

This part of IEC 60749 provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating high and low temperature extremes. Permanent changes in electrical and/or physical characteristics can result from these mechanical stresses.

 

Product Details

Edition:
04
Published:
01/05/2004
Number of Pages:
19
File Size:
1 file , 140 KB
Product Code(s):
DS-017, DS-017