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DANSK DS/EN IEC 60749-41 [ Active ]

Semiconductor devices – Mechanical and climatic test methods – Part 41: Standard reliability testing methods of non-volatile memory devices

standard by Dansk Standard , 09/08/2020

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Full Description

SAME AS IEC 60749-41

IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

 

Product Details

Edition:
20
Published:
09/08/2020
Number of Pages:
30
File Size:
1 file , 2.1 MB
Product Code(s):
DS-026, DS-026
 

Document History

  1. DANSK DSF/FPREN IEC 60749-41


    Semiconductor devices – Mechanical and climatic test methods – Part 41: Standard reliability testing methods of non-volatile memory devices

    • Historical Version

  2. DANSK DSF/PREN IEC 60749-41


    Semiconductor devices – Mechanical and climatic test methods – Part 41: Standard reliability testing methods of non-volatile memory devices

    • Historical Version

  3. DANSK DS/EN IEC 60749-41

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    Semiconductor devices – Mechanical and climatic test methods – Part 41: Standard reliability testing methods of non-volatile memory devices

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