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ECIA EIA-364-23B [ Revised ]

TP-23B Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets

standard by Electronic Components Industry Association , 12/01/2000

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Full Description

This test procedure may apply to any type or combination of current carrying members such as pin and socket contacts, relay contacts, wire and crimp connectors, or printed circuit board and contact.

Object

The object of this test procedure is to detail a standard method to measure the electrical resistance of two current carrying members in mutual contact. This test procedure specifies test voltages which will not disturb insulating films on the contacting surface nor cause asperity melting. This procedure addresses the effect of thermal EMF's, a source of measurement error.

 

Product Details

Edition:
B
Published:
12/01/2000
ANSI:
ANSI Approved
Number of Pages:
14
File Size:
0 files
 

Document History

  1. ECIA EIA-364-23D


    TP-23D Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets

    • Most Recent

  2. ECIA EIA-364-23C


    TP-23C Low Level Contact Resistance Test Procedure For Electrical Connectors and Sockets

    • Historical Version

  3. ECIA EIA-364-23C


    TP-23C Low Level Contact Resistance Test Procedure For Electrical Connectors and Sockets

    • Historical Version

  4. ECIA EIA/ECA-364-23C


    TP-23C LOW LEVEL CONTACT RESISTANCE TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS

    • Historical Version

  5. ECIA EIA-364-23B

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    TP-23B Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets

    • Historical Version

  6. ECIA 364-23A


    TP-23A Low Level Contact Resistance Test Procedure for Electrical Connectors

    • Historical Version