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IEC 60749-36 Ed. 1.0 b:2003

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

standard by International Electrotechnical Commission , 02/13/2003

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Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
 

Product Details

Edition:
1.0
Published:
02/13/2003
Number of Pages:
7
File Size:
1 file , 210 KB
Note:
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