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IEC 60749-7 Ed. 1.0 b:2002 [ Withdrawn ]

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

standard by International Electrotechnical Commission , 04/09/2002

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About This Item

 

Full Description

Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.
 

Product Details

Edition:
1.0
Published:
04/09/2002
Number of Pages:
15
File Size:
1 file , 430 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus, Canada
 

Document History

  1. IEC 60749-7 Ed. 2.0 b:2011


    Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

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  2. IEC 60749-7 Ed. 1.0 b CORR1:2003


    Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

    • Historical Version

  3. IEC 60749-7 Ed. 1.0 b:2002

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    Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

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Amendments, rulings, supplements, and errata

  1. IEC 60749-7 Ed. 1.0 b CORR1:2003

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    Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases