1762472

JEDEC JEP121A

REQUIREMENTS FOR MICROELECTRONIC SCREENING AND TEST OPTIMIZATION

standard by JEDEC Solid State Technology Association , 10/01/2006

View all product details

Most Recent

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $76.00
    • Add to Cart
    • Printed Edition + PDF
    • Immediate download
    • $103.00
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

The purpose of this document provides the basis for the optimization of 100% screening/stress operations and sample inspection test activities. This document is designed to assist the manufacturer in optimizing the test flow while maintaining and/or improving assurance of providing high quality and reliable product in an efficient manner. This will allow for optimization of testing that is not adding value, hence, reducing cycle time and costs.
 

Product Details

Published:
10/01/2006
Number of Pages:
35
File Size:
1 file , 190 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus