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BS ISO 16700:2016

Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

standard by British Standard / International Organization for Standardization , 07/31/2016

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Full Description

BS ISO 16700:2016 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. This International Standard does not apply to the dedicated critical dimension measurement SEM.


Cross References:
ISO/IEC 17025:2005
ISO Guide 30
ISO Guide 34
ISO Guide 35
ISO 5725-1
ISO/IEC Guide 98-3
GUM:1995


All current amendments available at time of purchase are included with the purchase of this document.
 

Product Details

Published:
07/31/2016
ISBN(s):
9780580890529
Number of Pages:
30
File Size:
1 file , 4 MB
Same As:
BS ISO 16700:2016
Product Code(s):
30317579, 30317579, 30317579
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This product is unavailable in Russia, Ukraine, Belarus
 

Document History

  1. BS ISO 16700:2016

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    Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

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  2. BS ISO 16700:2004


    Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

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