31.080.01: Semiconductor Devices In General

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  1. HISTORICAL

    ASTM E1161-09▹

    This document has been replaced. View the most recent version.

    Standard Practice for Radiologic Examination of Semiconductors and Electronic Components

    standard by ASTM International, 06/01/2009.

    Languages: English

    Historical Editions: ASTM E1161-21, ASTM E1161-09(2014), ASTM E1161-03, ASTM E1161-95

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  2. HISTORICAL

    ASTM E1161-09(2014)▹

    This document has been replaced. View the most recent version.

    Standard Practice for Radiologic Examination of Semiconductors and Electronic Components

    standard by ASTM International, 06/01/2014.

    Languages: English

    Historical Editions: ASTM E1161-21, ASTM E1161-09, ASTM E1161-03, ASTM E1161-95

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  3. MOST RECENT

    ASTM E1161-21▹

    Standard Practice for Radiographic Examination of Semiconductors and Electronic Components

    standard by ASTM International, 06/01/2021.

    Languages: English

    Historical Editions: ASTM E1161-09(2014), ASTM E1161-09, ASTM E1161-03, ASTM E1161-95

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  4. HISTORICAL

    ASTM E1161-95▹

    This document has been replaced. View the most recent version.

    Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components

    standard by ASTM International, 01/01/1995.

    Languages: English

    Historical Editions: ASTM E1161-21, ASTM E1161-09(2014), ASTM E1161-09, ASTM E1161-03

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  5. HISTORICAL

    ASTM E427-95(2000)▹

    This document has been replaced. View the most recent version.

    Standard Practice for Testing for Leaks Using the Halogen Leak Detector (Alkali-Ion Diode)

    standard by ASTM International, 07/10/2000.

    Languages: English

    Historical Editions: ASTM E427-95(2006)

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  6. MOST RECENT

    ASTM E427-95(2006)▹ [ Withdrawn ]

    Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode) (Withdrawn 2013)

    standard by ASTM International, 12/01/2006.

    Languages: English

    Historical Editions: ASTM E427-95(2000)

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  7. HISTORICAL

    ASTM E431-96(2002)▹

    This document has been replaced. View the most recent version.

    Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices

    standard by ASTM International, 12/10/1996.

    Languages: English

    Historical Editions: ASTM E431-96(2022), ASTM E431-96(2016), ASTM E431-96(2011), ASTM E431-96(2007), ASTM E431-96

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  8. HISTORICAL

    ASTM E431-96(2007)▹

    This document has been replaced. View the most recent version.

    Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices

    standard by ASTM International, 07/01/2007.

    Languages: English

    Historical Editions: ASTM E431-96(2022), ASTM E431-96(2016), ASTM E431-96(2011), ASTM E431-96, ASTM E431-96(2002)

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  9. HISTORICAL

    ASTM E431-96(2011)▹

    This document has been replaced. View the most recent version.

    Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices

    standard by ASTM International, 12/01/2011.

    Languages: English

    Historical Editions: ASTM E431-96(2022), ASTM E431-96(2016), ASTM E431-96(2007), ASTM E431-96, ASTM E431-96(2002)

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  10. HISTORICAL

    ASTM E431-96(2016)▹

    This document has been replaced. View the most recent version.

    Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices

    standard by ASTM International, 06/01/2016.

    Languages: English

    Historical Editions: ASTM E431-96(2022), ASTM E431-96(2011), ASTM E431-96(2007), ASTM E431-96, ASTM E431-96(2002)

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