31.200: Integrated Circuits. Microelectronics

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  1. HISTORICAL

    ASTM E1855-04▹

    This document has been replaced. View the most recent version.

    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    standard by ASTM International, 06/01/2004.

    Languages: English

    Historical Editions: ASTM E1855-20, ASTM E1855-15, ASTM E1855-10, ASTM E1855-05, ASTM E1855-05e1, ASTM E1855-04e1, ASTM E1855-96

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  2. HISTORICAL

    ASTM E1855-04e1▹

    This document has been replaced. View the most recent version.

    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    standard by ASTM International, 06/01/2004.

    Languages: English

    Historical Editions: ASTM E1855-20, ASTM E1855-15, ASTM E1855-10, ASTM E1855-05, ASTM E1855-05e1, ASTM E1855-04, ASTM E1855-96

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  3. HISTORICAL

    ASTM E1855-05▹

    This document has been replaced. View the most recent version.

    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    standard by ASTM International, 07/01/2005.

    Languages: English

    Historical Editions: ASTM E1855-20, ASTM E1855-15, ASTM E1855-10, ASTM E1855-05e1, ASTM E1855-04, ASTM E1855-04e1, ASTM E1855-96

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  4. HISTORICAL

    ASTM E1855-05e1▹

    This document has been replaced. View the most recent version.

    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    standard by ASTM International, 07/01/2005.

    Languages: English

    Historical Editions: ASTM E1855-20, ASTM E1855-15, ASTM E1855-10, ASTM E1855-05, ASTM E1855-04, ASTM E1855-04e1, ASTM E1855-96

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  5. HISTORICAL

    ASTM E1855-10▹

    This document has been replaced. View the most recent version.

    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    standard by ASTM International, 10/01/2010.

    Languages: English

    Historical Editions: ASTM E1855-20, ASTM E1855-15, ASTM E1855-05, ASTM E1855-05e1, ASTM E1855-04, ASTM E1855-04e1, ASTM E1855-96

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  6. HISTORICAL

    ASTM E1855-15▹

    This document has been replaced. View the most recent version.

    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    standard by ASTM International, 10/01/2015.

    Languages: English

    Historical Editions: ASTM E1855-20, ASTM E1855-10, ASTM E1855-05, ASTM E1855-05e1, ASTM E1855-04, ASTM E1855-04e1, ASTM E1855-96

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  7. MOST RECENT

    ASTM E1855-20▹

    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    standard by ASTM International, 02/01/2020.

    Languages: English

    Historical Editions: ASTM E1855-15, ASTM E1855-10, ASTM E1855-05, ASTM E1855-05e1, ASTM E1855-04, ASTM E1855-04e1, ASTM E1855-96

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  8. HISTORICAL

    ASTM E1855-96▹

    This document has been replaced. View the most recent version.

    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    standard by ASTM International, 12/10/1996.

    Languages: English

    Historical Editions: ASTM E1855-20, ASTM E1855-15, ASTM E1855-10, ASTM E1855-05, ASTM E1855-05e1, ASTM E1855-04, ASTM E1855-04e1

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  9. HISTORICAL

    ASTM F1259M-96▹

    This document has been replaced. View the most recent version.

    Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric]

    standard by ASTM International, 01/01/1996.

    Languages: English

    Historical Editions: ASTM F1259M-96(2003)

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  10. HISTORICAL

    ASTM F1260M-96▹

    This document has been replaced. View the most recent version.

    Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]

    standard by ASTM International, 01/01/1996.

    Languages: English

    Historical Editions: ASTM F1260M-96(2003)

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