31.080.30: Transistors
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HISTORICAL
IEEE 1005-1991
This document has been replaced. View the most recent version.
IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays
standard by IEEE, 10/17/1991.
Languages: English
Historical Editions: IEEE 1005-1998
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MOST RECENT
IEEE 1005-1998 [ Withdrawn ]
IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays
standard by IEEE, 02/09/1999.
Languages: English
Historical Editions: IEEE 1005-1991
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MOST RECENT
IEEE 1620.1-2006
IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
standard by IEEE, 11/08/2006.
Languages: English
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HISTORICAL
IEEE 1620-2004
This document has been replaced. View the most recent version.
Standard for Test Methods for the Characterization of Organic Transistors and Materials
standard by IEEE, 04/29/2004.
Languages: English
Historical Editions: IEEE 1620-2008
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MOST RECENT
IEEE 1620-2008
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
standard by IEEE, 12/05/2008.
Languages: English
Historical Editions: IEEE 1620-2004
- Redlines
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MOST RECENT
IEEE 581-1978 [ Withdrawn ]
IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors
standard by IEEE, 04/28/1978.
Languages: English
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IEEE/IEC 62860-1-2013
IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
standard by IEEE/IEC, 07/30/2013.
Languages: English
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IEEE/IEC 62860-2013
IEC/IEEE Test methods for the characterization of organic transistors and materials
standard by IEEE/IEC, 07/30/2013.
Languages: English
- MULTI-USER
