31.180: Printed circuits and boards
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MOST RECENT
IEEE 1101.7-1995
IEEE Standard for Space Applications Module, Extended Height Format E Form Factor
standard by IEEE, 07/11/1995.
Languages: English
- MULTI-USER
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MOST RECENT
IEEE 1149.10-2017
IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
standard by IEEE, 07/28/2017.
Languages: English
- MULTI-USER
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HISTORICAL
IEEE 1149.1-1990
This document has been replaced. View the most recent version.
IEEE Standard Test Access Port and Boundary-Scan Architecture
standard by IEEE, 05/21/1990.
Languages: English
Amendments, rulings, and supplements: IEEE 1149.1b-1994
Historical Editions: IEEE 1149.1-2013, IEEE 1149.1-2001
- MULTI-USER
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HISTORICAL
IEEE 1149.1-2001
This document has been replaced. View the most recent version.
IEEE Standard Test Access Port and Boundary Scan Architecture
standard by IEEE, 07/23/2001.
Languages: English
Historical Editions: IEEE 1149.1-2013, IEEE 1149.1-1990
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MOST RECENT
IEEE 1149.1-2013
IEEE Standard for Test Access Port and Boundary-Scan Architecture
standard by IEEE, 05/13/2013.
Languages: English
Historical Editions: IEEE 1149.1-2001, IEEE 1149.1-1990
- Redlines
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HISTORICAL
IEEE 1149.4-1999
This document has been replaced. View the most recent version.
IEEE Standard for a Mixed-Signal Test Bus
standard by IEEE, 03/20/2000.
Languages: English
Historical Editions: IEEE 1149.4-2010
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MOST RECENT
IEEE 1149.4-2010
IEEE Standard for a Mixed-Signal Test Bus
standard by IEEE, 03/18/2011.
Languages: English
Historical Editions: IEEE 1149.4-1999
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MOST RECENT
IEEE 1149.8.1-2012
IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components
standard by IEEE, 08/09/2012.
Languages: English
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HISTORICAL
IEEE 1532-2000
This document has been replaced. View the most recent version.
IEEE Standard for In-System Configuration of Programmable Devices
standard by IEEE, 01/12/2000.
Languages: English
Historical Editions: IEEE 1532-2002, IEEE 1532-2001
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MOST RECENT
IEEE 1687-2014
IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
standard by IEEE, 12/05/2014.
Languages: English
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