Electron Devices
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HISTORICAL
IEEE 1005-1991
This document has been replaced. View the most recent version.
IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays
standard by IEEE, 10/17/1991.
Languages: English
Historical Editions: IEEE 1005-1998
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HISTORICAL
IEEE 1043-1989
This document has been replaced. View the most recent version.
IEEE Recommended Practice for Voltage-Endurance Testing of Form-Wound Bars and Coils
standard by IEEE, 12/07/1989.
Languages: English
Historical Editions: IEEE 1043-1996
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MOST RECENT
IEEE 1043-1996
IEEE Recommended Practice for Voltage-Endurance Testing of Form-Wound Bars and Coils
standard by IEEE, 11/30/1997.
Languages: English
Historical Editions: IEEE 1043-1989
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MOST RECENT
IEEE 1181-1991
IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated- Circuit Process Characterization
standard by IEEE, 12/13/1991.
Languages: English
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MOST RECENT
IEEE 159-1952 [ Withdrawn ]
IEEE Standards on Gas-Filled Radiation Counter Tubes: Methods of Testing, 1952
standard by IEEE, 08/01/1952.
Languages: English
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MOST RECENT
IEEE 161-1971
IEEE Standard Definitions on Electron Tubes
standard by IEEE, 11/30/1970.
Languages: English
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HISTORICAL
IEEE 1851-2012
This document has been replaced. View the most recent version.
IEEE Standard for Design Criteria of Integrated Sensor-Based Test Applications for Household Appliances
standard by IEEE, 08/15/2012.
Languages: English
Historical Editions: IEEE 1851-2023
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MOST RECENT
IEEE 216-1960 [ Withdrawn ]
IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms
standard by IEEE, 10/31/1960.
Languages: English
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MOST RECENT
IEEE 255-1963 [ Withdrawn ]
IEEE Standard Letter Symbols for Semiconductor Devices
standard by IEEE, 12/01/1963.
Languages: English
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HISTORICAL
IEEE 2700-2014
This document has been replaced. View the most recent version.
IEEE Standard for Sensor Performance Parameter Definitions
standard by IEEE, 08/12/2014.
Languages: English
Historical Editions: IEEE 2700-2017
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