19.080: Electrical and electronic testing

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  1. HISTORICAL

    1375305

    IEEE 1671-2006

    This document has been replaced. View the most recent version.

    IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

    standard by IEEE, 12/15/2006.

    Languages: English

    Historical Editions: IEEE/IEC 61671-2012IEEE 1671-2010

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  2. HISTORICAL

    1777606

    IEEE 1671-2010

    This document has been replaced. View the most recent version.

    IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

    standard by IEEE, 01/20/2011.

    Languages: English

    Historical Editions: IEEE/IEC 61671-2012IEEE 1671-2006

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  3. HISTORICAL

    1891681

    IEEE 1812-2014

    This document has been replaced. View the most recent version.

    IEEE Trial-Use Guide for Testing Permanent Magnet Machines

    standard by IEEE, 02/24/2015.

    Languages: English

    Historical Editions: IEEE 1812-2023

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  4. MOST RECENT

    2253517

    IEEE 1812-2023

    IEEE Guide for Testing Permanent Magnet Machines

    standard by IEEE, 12/11/2023.

    Languages: English

    Historical Editions: IEEE 1812-2014

    • Redlines
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  5. MOST RECENT

    1891494

    IEEE 1871.1-2014

    IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters

    standard by IEEE, 02/10/2015.

    Languages: English

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  6. MOST RECENT

    1927189

    IEEE 1871.2-2017

    IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment

    standard by IEEE, 03/14/2018.

    Languages: English

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  7. MOST RECENT

    2523223

    IEEE 2845-2023

    IEEE Trial-Use Standard for Testing and Evaluating the Dielectric Performance of Celebratory Balloons in Contact with Overhead Power Distribution Lines Rated up to 38 kV System Voltage

    standard by IEEE, 12/01/2023.

    Languages: English

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  8. HISTORICAL

    1777670

    IEEE 4-1978

    This document has been replaced. View the most recent version.

    IEEE Standard Techniques for High Voltage Testing

    standard by IEEE, 11/30/1977.

    Languages: English

    Historical Editions: IEEE 4-2013IEEE 4-1995

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  9. HISTORICAL

    15227

    IEEE 4-1995

    This document has been replaced. View the most recent version.

    IEEE Standard Techniques for High-Voltage Testing

    standard by IEEE, 10/12/1995.

    Languages: English

    Amendments, rulings, and supplements: IEEE 4a-2001

    Historical Editions: IEEE 4-2013IEEE 4-1978

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  10. MOST RECENT

    1857195

    IEEE 4-2013

    IEEE Standard for High-Voltage Testing Techniques

    standard by IEEE, 05/10/2013.

    Languages: English

    Historical Editions: IEEE 4-1995IEEE 4-1978

    • Redlines
    • 👥MULTI-USER