Test Instrumentation and Techniques
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MOST RECENT
IEEE 1057-2017
IEEE Standard for Digitizing Waveform Recorders
standard by IEEE, 01/26/2018.
Languages: English
Historical Editions: IEEE 1057-2007, IEEE 1057-1994, IEEE 1057-1989
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HISTORICAL
IEEE 1122-1987
This document has been replaced. View the most recent version.
IEEE Standard for Digital Recorders for Measurements in High-Voltage Impulse Tests
standard by IEEE, 06/16/1988.
Languages: English
Historical Editions: IEEE 1122-1998
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MOST RECENT
IEEE 1122-1998
IEEE Standard for Digital Recorders for Measurements in High-Voltage Impulse Tests
standard by IEEE, 06/18/1998.
Languages: English
Historical Editions: IEEE 1122-1987
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MOST RECENT
IEEE 1149.10-2017
IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
standard by IEEE, 07/28/2017.
Languages: English
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MOST RECENT
IEEE 1149.4-2010
IEEE Standard for a Mixed-Signal Test Bus
standard by IEEE, 03/18/2011.
Languages: English
Historical Editions: IEEE 1149.4-1999
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MOST RECENT
IEEE 1149.8.1-2012
IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components
standard by IEEE, 08/09/2012.
Languages: English
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MOST RECENT
IEEE 118-1978
IEEE Standard Test Code for Resistance Measurement
standard by IEEE, 05/29/1978.
Languages: English
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MOST RECENT
IEEE 1226-1998 [ Withdrawn ]
IEEE Standard for a Broad-Based Environment for Test (ABBET(TM)), Overview and Architecture
standard by IEEE, 06/24/1999.
Languages: English
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MOST RECENT
IEEE 1232-2010
IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)
standard by IEEE, 03/25/2011.
Languages: English
Historical Editions: IEEE 1232-2002, IEEE 1232-1995
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MOST RECENT
IEEE 1377-2012
IEEE Standard for Utility Industry Metering Communication Protocol Application Layer (End Device Data Tables)
standard by IEEE, 08/10/2012.
Languages: English
Historical Editions: IEEE 1377-1997
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