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About This Item
Full Description
Cross References:
IEC 60749-4
IEC 60749-5
IEC 60749-11
IEC 60749-20:2008
IEC 60749-24
IEC 60749-25:2003
IEC 60749-33
EN 60749-4:2002
EN 60749-5:2003
EN 60749-11:2002
EN 60749-20:2009
EN 60749-24:2004
EN 60749-25:2003
EN 60749-33:2004
Incorporates the following:
Amendment, September 2011. Amends and replaces BS EN 60749-30:2005
Document History
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BS EN IEC 60749-30:2020
Semiconductor devices. Mechanical and climatic test methods-Preconditioning of non-hermetic surface mount devices prior to reliability testing- Most Recent
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BS EN 60749-30:2005+A1:2011
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Semiconductor devices. Mechanical and climatic test methods-Preconditioning of non-hermetic surface mount devices prior to reliability testing- Historical Version
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BS EN 60749-30:2005
Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing- Historical Version