1257200

BS EN 60749-30:2005

Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing

standard by British-Adopted European Standard , 01/27/2006

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Cross References:
IEC 60749-4
IEC 60749-5
IEC 60749-11
IEC 60749-20:2002
IEC 60749-24
IEC 60749-25:2003
IEC 60749-33
EN 60749-4: 2002
EN 60749-5:2003
EN 60749-11:2002
EN 60749-20:2003
EN 60749-24:2004
EN 60749-25:2003
EN 60749-33:2004
 

Product Details

Published:
01/27/2006
ISBN(s):
0580477525
Number of Pages:
16
File Size:
1 file , 750 KB
Product Code(s):
30105347, 30105347, 30105347
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. BS EN IEC 60749-30:2020


    Semiconductor devices. Mechanical and climatic test methods-Preconditioning of non-hermetic surface mount devices prior to reliability testing

    • Most Recent

  2. BS EN 60749-30:2005+A1:2011


    Semiconductor devices. Mechanical and climatic test methods-Preconditioning of non-hermetic surface mount devices prior to reliability testing

    • Historical Version

  3. BS EN 60749-30:2005

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    Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing

    • Historical Version