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Full Description

BS ISO 19606:2017 describes a method to evaluate the adequateness of a probe tip for fine-ceramic thin-film surface roughness measurements by atomic force microscopy, of surfaces with an arithmetical mean roughness, Ra, in the range of about 1 nm to 30 nm and a mean width of roughness profile elements, RSm, in the range of about 0,04 µm to 2,5 µm.


Cross References:
ISO 4287
ISO 4288
ISO 11039
ISO 11952
ISO 18115-2
ISO 25178-2
ISO 11775
ISO 16610-21
ISO 25178-3


All current amendments available at time of purchase are included with the purchase of this document.