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IEC 60749-32 Ed. 1.1 b:2010

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) CONSOLIDATED EDITION

standard by International Electrotechnical Commission , 11/29/2010

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Full Description

IEC 60749-32:2002+A1:2010 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. This consolidated version consists of the first edition (2002) and its amendment 1 (2010). Therefore, no need to order amendment in addition to this publication.
 

Product Details

Edition:
1.1
Published:
11/29/2010
Number of Pages:
9
File Size:
1 file , 160 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus, Canada
 

Document History

  1. IEC 60749-32 Ed. 1.1 b:2010

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    Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) CONSOLIDATED EDITION

    • Most Recent

  2. IEC 60749-32 Ed. 1.0 b:2002


    Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

    • Historical Version