TC 202/SC 1: Terminology

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  1. MOST RECENT

    1869922

    ISO 15932:2013

    Microbeam analysis - Analytical electron microscopy - Vocabulary

    standard by International Organization for Standardization, 12/15/2013.

    Languages: English

    • 👥MULTI-USER
  2. HISTORICAL

    1318305

    ISO 23833:2006

    This document has been replaced. View the most recent version.

    Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary

    standard by International Organization for Standardization, 12/01/2006.

    Languages: English

    Historical Editions: ISO 23833:2013

    • 👥MULTI-USER
  3. MOST RECENT

    1855697

    ISO 23833:2013

    Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary

    standard by International Organization for Standardization, 04/15/2013.

    Languages: English

    Historical Editions: ISO 23833:2006

    • 👥MULTI-USER
  4. HISTORICAL

    1578891

    ISO 22493:2008

    This document has been replaced. View the most recent version.

    Microbeam analysis - Scanning electron microscopy - Vocabulary

    standard by International Organization for Standardization, 10/01/2008.

    Languages: English

    Historical Editions: ISO 22493:2014

    • 👥MULTI-USER
  5. MOST RECENT

    1876247

    ISO 22493:2014

    Microbeam analysis - Scanning electron microscopy - Vocabulary

    standard by International Organization for Standardization, 04/15/2014.

    Languages: English

    Historical Editions: ISO 22493:2008

    • 👥MULTI-USER