31.080.01: Semiconductor devices in general
Search Results
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UNE-EN 60617-5:1997
GRAPHICAL SYMBOLS FOR DIAGRAMS. PART 5: SEMICONDUCTORS AND ELECTRON TUBES.
standard by UNE-EN, 07/24/1997.
Languages:
- MULTI-USER
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UNE-EN 60749-10:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock.
standard by UNE-EN, 05/30/2003.
Languages:
- MULTI-USER
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UNE-EN 60749-11:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 11: Rapid change of temperature - Two-fluid-bath method.
standard by UNE-EN, 05/30/2003.
Languages:
- MULTI-USER
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UNE-EN 60749-1:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 1: General
standard by UNE-EN, 05/28/2004.
Languages:
- MULTI-USER
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UNE-EN 60749-12:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 12: Vibration, variable frequency.
standard by UNE-EN, 05/30/2003.
Languages:
- MULTI-USER
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UNE-EN 60749-13:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 13: Salt atmosphere.
standard by UNE-EN, 05/30/2003.
Languages:
- MULTI-USER
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UNE-EN 60749-14:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
standard by UNE-EN, 06/11/2004.
Languages:
- MULTI-USER
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UNE-EN 60749-15:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 15: Resistance to soldering temperature for through-hole mounted devices
standard by UNE-EN, 11/21/2003.
Languages:
- MULTI-USER
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UNE-EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
standard by UNE-EN, 11/21/2003.
Languages:
- MULTI-USER
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UNE-EN 60749-17:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 17: Neutron irradiation
standard by UNE-EN, 11/21/2003.
Languages:
- MULTI-USER
