31.080.01: Semiconductor devices in general
Search Results
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UNE-EN 60749-18:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 18: Ionizing radiation (total dose)
standard by UNE-EN, 11/21/2003.
Languages:
- MULTI-USER
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UNE-EN 60749-19:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
standard by UNE-EN, 11/21/2003.
Languages:
Amendments, rulings, and supplements: UNE-EN 60749-19:2003/A1:2011
- MULTI-USER
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UNE-EN 60749-19:2003/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Amendment by UNE-EN, 01/19/2011.
Languages:
- MULTI-USER
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UNE-EN 60749-20:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
standard by UNE-EN, 06/11/2004.
Languages:
- MULTI-USER
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UNE-EN 60749-2:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
standard by UNE-EN, 05/30/2003.
Languages:
- MULTI-USER
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UNE-EN 60749-22:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 22: Bond strength
standard by UNE-EN, 03/26/2004.
Languages:
- MULTI-USER
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UNE-EN 60749-23:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
standard by UNE-EN, 03/16/2005.
Languages:
- MULTI-USER
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UNE-EN 60749-24:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
standard by UNE-EN, 03/16/2005.
Languages:
- MULTI-USER
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UNE-EN 60749-25:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling
standard by UNE-EN, 06/11/2004.
Languages:
- MULTI-USER
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UNE-EN 60749-29:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 29: Latch-up test
standard by UNE-EN, 07/09/2004.
Languages:
- MULTI-USER
